doc. no : qw0905- rev. : date : - 2008 09 - sep. LUG12243-PF-08 a data sheet super bright round type led lamps LUG12243-PF lead-free parts pb ligitek electronics co.,ltd. property of ligitek only
25.0min note : 1.all dimension are in millimeter tolerance is 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. -60 100%50% 75% directivity radiation -30 60 75% 25% 0 25%50%100% 30 0 - + 1.0min 2.54typ 0.5 typ 1.5max package dimensions part no.LUG12243-PF 5.3 1.0 4.0 3.0 ligitek electronics co.,ltd. property of ligitek only page1/5
574 note : 1.the forward voltage data did not including 0.1v testing tolerance. 2. the luminous intensity data did not including 15% testing tolerance. algainp LUG12243-PF water clear green emitted lens typ. 1500 900 1.7 2.6 20 min.max.min. 20 static electricity or power surge will damage the led. use of a conductive wrist band or anti-electrosatic glove is recommended when handing these led. all devices, equipment and machinery must be properly grounded. dominant wave length dnm typical electrical & optical characteristics (ta=25 ) material part no color storage temperature * tstg luminous intensity @20ma(mcd) forward voltage @20ma(v) spectral halfwidth nm viewing angle 2 1/2 (deg) -40 ~ +100 absolute maximum ratings at ta=25 peak forward current duty 1/10@10khz ir reverse current @5v electrostatic discharge( * ) operating temperature esd t opr power dissipation pd i fp parameter forward current i f symbol a 10 2000 -40 ~ +85 v 65 75 mw ma ratings 25 green ma unit ligitek electronics co.,ltd. property of ligitek only LUG12243-PF part no. page 2/5
r e l a t i v e i n t e n s i t y @ 2 0 m a n o r m a l i z e @ 2 5 ligitek electronics co.,ltd. property of ligitek only typical electro-optical characteristics curve r e l a t i v e i n t e n s i t y n o r m a l i z e @ 2 0 m a r e l a t i v e i n t e n s i t y @ 2 0 m a 500 0 wavelength (nm) 550600650 0.5 f o r w a r d v o l t a g e @ 2 0 m a n o r m a l i z @ 2 5 fig.5 relative intensity vs. wavelength 1.0 ambient temperature( ) 0.8 -20060 204080 1.0 0.9 1.1 fig.3 forward voltage vs. temperature 1.2 f o r w a r d c u r r e n t ( m a ) 40 forward voltage(v) 00.5 0 2.0 1.01.53.0 2.5 10 20 30 fig.1 forward current vs. forward voltage 60 50 ug chip LUG12243-PF part no. 0.5 ambient temperature( ) 60 0 -200204080 2.0 1.0 1.5 fig.4 relative intensity vs. temperature 2.5 forward current(ma) 100 10 1.0 0 1000 1.0 fig.2 relative intensity vs. forward current 2.0 page 3/5
dip soldering preheat: 120 c max preheat time: 60seconds max ramp-up 2 c/sec(max) ramp-down:-5 c/sec(max) solder bath:260 c max dipping time:3 seconds max distance:2mm min(from solder joint to body) note: 1.wave solder should not be made more than one time. 2.you can just only select one of the soldering conditions as above. 25 0 0 2 /sec max preheat 50 time(sec) 100 150 260 c3sec max 260 120 temp( c) 5 /sec max soldering condition(pb-free) 1.iron: soldering iron:30w max temperature 350 c max soldering time:3 seconds max(one time only) distance:2mm min(from solder joint to body) 2.wave soldering profile ligitek electronics co.,ltd. property of ligitek only LUG12243-PF part no. page 4/5
mil-std-202:103b jis c 7021: b-11 high temperature high humidity test 1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs the purpose of this test is the resistance of the device under tropical for hours. this test intended to see soldering well performed or not. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. 1.t.sol=230 5 2.dwell time=5 1sec solderability test 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles 1.t.sol=260 5 2.dwell time= 10 1sec. solder resistance test thermal shock test mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 ligitek electronics co.,ltd. property of ligitek only this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. description reliability test: 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, +72hrs) 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) low temperature storage test 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) high temperature storage test test condition operating life test test item LUG12243-PF part no. mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 reference standard 5/5 page
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